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Volume 3,Issue 7

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26 August 2025

Exploration of the Reform of the Assessment Mode for "Analog Integrated Circuit Analysis and Design"

Yongqian Du1 Guifang Li1 Shibin Liu1
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1 The School of Electronics and Information, Northwestern Polytechnical University, Xi'an 710072, Shaanxi, China
LNE 2025 , 3(7), 35–38; https://doi.org/10.18063/LNE.v3i7.731
© 2025 by the Author. Licensee Whioce Publishing, Singapore. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution 4.0 International License ( https://creativecommons.org/licenses/by/4.0/ )
Abstract

The emerging engineering education is the leading force in the construction of a strong education country, which aims to cultivate outstanding engineering innovation talents, the key point of which is to improve the talent cultivation capabilities. This article takes "Analysis and Design of Analog Integrated Circuits" as an example to explore a new mode for engineering education assessment for integrated circuits, under the background of cultivating emerging engineering talents. An assessment mode based on “enhancing engineering capabilities and constructing a multi-dimensional tightly coupled knowledge system” is proposed, which transforms the final assessment at the end of course into a process-oriented "milestone-based" assessment approach. It provides a solution for establishing an new evaluation system that adapts to the training of emerging engineering talents in integrated circuits.

Keywords
Integrated circuit
Reform of assessment mode
Emerging Engineering Education
References

[1]Emerging Engineering Education, http://eee.tju.edu.cn/.

[2]Behzad R, 2024, "Education of Chip Designers at a Large Scale: A Proposal [Society News]", IEEE Solid-State Circuits Magazine, 16(2): 76-83.

[3]Roy S, Azad A N M W, Baidya S, Alam M K, Khan F, "Powering Solutions for Biomedical Sensors and Implants Inside the Human Body: A Comprehensive Review on Energy Harvesting Units, Energy Storage, and Wireless Power Transfer Techniques," in IEEE Transactions on Power Electronics, 37(10): 12237-12263.

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