The rapid iteration of intelligent algorithms provides a core foundation for advancing electronic component defect detection technology, effectively addressing industry challenges such as low accuracy, poor efficiency, and limited adaptability associated with traditional detection methods. Focusing on electronic component defect identification and detection, this paper analyzes the fundamental principles of integrating intelligent algorithms with defect detection, identifies key optimization directions for industrial applications, explores algorithmic applications across various defect types, and outlines practical implementation pathways. The study aims to offer theoretical insights for establishing an efficient and precise intelligent defect detection system and promote the widespread adoption of intelligent algorithms in electronic manufacturing quality control.